ZEISS Crossbeam: Your FIB-SEM for Fastest Nanotomography & Nanofabrication

July 17, 2015
With Crossbeam you combine the imaging and analytical performance of the GEMINI column with the ability of a next-generation FIB for material processing and sample preparation on a nanoscopic scale. Use the modular platform concept and the open and easily extendable software architecture of this 3D nano-workstation for high throughput nanotomography and nanofabrication of even your most demanding, charging or magnetic samples. http://www.zeiss.com/crossbeam
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ZEISS MultiSEM 505 - The World's Fastest Scanning Electron Microscope
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