The World’s Fastest Scanning Electron Microscope Just Got Even Faster

October 20, 2015 ZEISS Microscopy

Introducing ZEISS MultiSEM 506 acquiring more than 2 Terapixel per hour

At the annual Neuroscience meeting in Chicago, October 17- 21, 2015, ZEISS presents a new variant of the world’s fastest scanning electron microscope: ZEISS MultiSEM 506 features 91 beams working in parallel and increases the throughput of ZEISS MultiSEM 505 by a factor of three.

ZEISS MultiSEM 506: The World's Fastest Scanning Electron Microscope
ZEISS MultiSEM 506: The World’s Fastest Scanning Electron Microscope

The unrivaled net acquisition speed of more than 2 Terapixel per hour enables large-scaled experiments such as imaging of cubic millimeters of brain tissue at nanometer resolution for the analysis of neural circuits. For the research work conducted as part of numerous brain initiatives this will speed up the ability to map whole areas of the brain to understand the neural network.

The new instrument demonstrates that ZEISS multi-beam technology is scalable and will satisfy future throughput needs also in other fields, for example in semiconductor applications. A first prototype of ZEISS MultiSEM 506 has already been installed at the Max Planck Institute of Neurobiology in Munich earlier this year.

Zebrafish brain, image acquired with ZEISS MultiSEM 506
Zebrafish brain, image acquired with ZEISS MultiSEM 506

Zebrafish brain, 70 nm thick section, image acquired with ZEISS MultiSEM 506 covering a hexagonal field of view of 200 µm x 180 µm at 5 nm pixel size. Courtesy of Christel Genoud, Friedrich-Miescher-Institute, Basel, Switzerland 

 

ZEISS MultiSEM 505 and 506 are designed for continuous operation and fitted with the intuitive ZEISS ZEN Software which provides new features like automated section detection of serial tissue sections. On November 12, 2015 ZEISS offers a webinar to give deeper insight into ZEISS MultiSEM technology and its applications: Register today for free!

 

Neuroscience: Connectomes make the map – Nature Technology Feature with ZEISS MultiSEM technology 

 

Interested in more details about ZEISS MultiSEM for your specific application? Visit our website to join the Research Partner Program and get in contact!

 

Link to press release

 

Can’t see the embedded video? Click here!

 

The post The World’s Fastest Scanning Electron Microscope Just Got Even Faster appeared first on Microscopy News Blog.

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