ZEISS Presents New Family of Axio Observer Microscopes for Materials Imaging

October 22, 2015 ZEISS Microscopy

Choose between 3 stands for your perfect results in metallography

New ZEISS Axio Observer Family for Metallurgy and Materials Imaging
New ZEISS Axio Observer Family for Metallurgy and Materials Imaging

The new ZEISS Axio Observer family for metallurgy and materials imaging is fast, flexible, and economic: Take advantage of Axio Observer’s inverted construction to investigate a large number of samples in no time at all – or to explore heavy ones, just as efficiently. There’s no need to refocus, even when changing magnification or switching samples.

Axio Observer combines the proven quality of ZEISS optics with automated components to give you reliable, reproducible results. Using dedicated software modules you can analyze, for example, non-metallic inclusions, grain sizes and phases – it’s fully automatic.

Axio Observer is your open imaging platform: invest in only the features you need today. As requirements change, a simple upgrade keeps your system ready for all materials applications.

Spherulitic graphite in nodular grey cast iron, polarization contrast with lambda plate, objective: EC Epiplan-NEOFLUAR 50×/0.80 HD DIC. Imaged with ZEISS Axio Observer and Axiocam
Spherulitic graphite in nodular grey cast iron, polarization contrast with lambda plate, objective: EC Epiplan-NEOFLUAR 50×/0.80 HD DIC. Imaged with ZEISS Axio Observer and Axiocam

Save Time in Metallographic Investigations

As an inverted microscope platform, Axio Observer makes work so much more enjoyable. Whether investigating a large number or even heavy samples, you’ll save time in both sample preparation and investigation. Meanwhile, its inverted design facilitates parallel alignment to the objective lens. Observe more samples in less time: simply put your specimen on the stage, focus once and keep the focus for all further magnifications and samples.

Count on Reliable Results and Brilliant Images

You will appreciate the stable imaging conditions of Axio Observer, especially when working with high magnifications. Homogeneous illumination across the entire field of view produces brilliant images. And you will get reliable, reproducible results every time, thanks to the proven optical quality of ZEISS combined with automated components. Profit from short time-to-image for your metallographic structure analysis with dedicated software modules, e.g. NMI, Grains, Multiphase.

Upgrade Your System

Keep an eye on your budget as well as your samples. With Axio Observer, you invest only in the features you need now. You can always upgrade your system, simply and economically, any time you need to. Choose between encoded or motorized components and a range of accessories – you can depend on having any relevant contrasting techniques your application requires.

Barker-etched aluminum, reflected light, circular polarization contrast with lambda plate, objective: EC Epiplan-NEOFLUAR 5×/0.13 HD DIC. Imaged with ZEISS Axio Observer and Axiocam
Barker-etched aluminum, reflected light, circular polarization contrast with lambda plate, objective: EC Epiplan-NEOFLUAR 5×/0.13 HD DIC. Imaged with ZEISS Axio Observer and Axiocam

Choose Between Three Different Stands

Control all motorized components of your Axio Observer 7 materials with its touchscreen display. Automatic Component Recognition (ACR) means it will always recognize the settings for objectives and filtersets you have chosen. With Axio Observer 5 materials, nearly all components can be read out or even motorized. And Axio Observer 3 materials comes with an encoded nosepiece, light manager, CAN and USB interface that enables a read-out of the magnification.

Take Advantage of a Variety of Stage Inserts 

Select from a variety of stage inserts to tailor the system to your needs. The high-grade spring steel will not yield under loads, even when examining many samples. Thus you can be sure that the optical reference plane is maintained. Stage inserts come with different inside apertures to match standard specimen diameters, plus a 10 mm aperture for very small specimens.

Get Crisp Images with Polarization Contrast 

Investigate your samples with polarization contrast using fixed analyzers, a measuring analyzer rotating through 360° and a rotating analyzer with rotating full-wave plate. Now, you can also use a rotatable polarizer to change the direction of incidence of the polarized light. This also makes bireflection and pleochroism visible on anisotropic samples. In addition, some ore phases display anisotropy in the polarized reflected light, whereby a color change is generated depending on the placement of the polarizer a few degrees +/- from the marked position.

Niccolite, reflected light, polarization contrast with lambda plate, EC Epiplan-NEOFLUAR 20×/0.50 HD DIC. Imaged with ZEISS Axio Observer and Axiocam
Niccolite, reflected light, polarization contrast with lambda plate, EC Epiplan-NEOFLUAR 20×/0.50 HD DIC. Imaged with ZEISS Axio Observer and Axiocam

A Choice of Contrasting Techniques

Enjoy maximum homogeneity and a stray light free image background in brightfield and darkfield – disturbing stray light is minimized and color aberration is reduced. Investigate your samples with polarization contrast – using fixed analyzers, a measuring analyzer rotating through 360° and a rotating analyzer with rotating full-wave plate. Visualize bireflection and pleochroism on anisotropic samples even if no rotary stage is available. Take advantage of Circular Differential Interference Contrast (C-DIC), a polarization-optical technique which uses circularly polarized light.

Typical applications and samples include grain size analysis, NMI (non-metallic inclusions), birifringent samples (ores, metals, metal alloys, coals, ceramic), analysis of layer thickness and graphite particles, and multiphase analysis.

 

Interested in more details? Visit our website, download the brochure, and get in contact with our experts: together we’ll discuss the perfect solution for your application!

 

More hi-res materials and metallography imaging with ZEISS Axio Observer on our flickr channel!

 

 

The post ZEISS Presents New Family of Axio Observer Microscopes for Materials Imaging appeared first on Microscopy News Blog.

Previous Article
Report from the EMBL-EMBO Symposium ‘Seeing is Believing’ 2015
Report from the EMBL-EMBO Symposium ‘Seeing is Believing’ 2015

Learning about newest trends in light microscopy from Nobel Prize laureates and ZEISS From October 6 -10, 2...

Next Article
ZEISS Axio Scan.Z.1 - High Throughput Imaging with Virtual Slides
ZEISS Axio Scan.Z.1 - High Throughput Imaging with Virtual Slides

New applications in histology and geology with ZEISS Axio Scan.Z1 slide scanner ZEISS Axio Scan.Z1 – Your F...