ZEISS Crossbeam 540: Circuit editing with Prober Shuttle PS8 by Kleindiek Nanotechnik

October 7, 2016
A metal line is milled away with the ion gun, creating an open. A new line is deposited using GIS deposition. The process is observed visually using the electron microscope and electrically by probing the line during the experiment. http://www.zeiss.com/crossbeam - http://www.nanotechnik.com/ Video courtesy of Kleindiek Nanotechnik GmbH
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