ZEISS and Microscopy & Analysis Present Webinars for 3D Materials Science

November 7, 2016 ZEISS Microscopy

A Dynamic Research Arena, Any Way You Slice It

PEFC Catalyst Layer – Showing porosity and connected pore space. Imaged with ZEISS Xradia Versa by Carnegie Mellon University.

Achieving insights into the microstructure of materials across several length scales in three dimensions is key in today’s microscopy workflows. The upcoming webinar on Thursday, November 10 will focus on a collection of 3D acquisition techniques, in particular touching confocal light microscopy, focused ion beam scanning electron microscopy (FIB-SEM), X-ray microscopy and correlative workflows.


The design of multi-scale correlative imaging experiments and the acquisition of 3D data over multiple microscopy modalities are described by means of application examples such as metals, composites, and energy materials.

Scratch on glass surface. 3D topography with ZEISS LSM 800 for materials.

What you will learn:

  • how to image and measure surface topography with light microscopy contrasting techniques and combine them with surface topography in a confocal light microscope
  • how to acquire 3D FIB-SEM data with speed, ease and best z-resolution
  • how to span multiple length scales non-destructively in 3D with X-ray microscopy including absorption contrast, phase contrast and diffraction contrast tomography
  • how to build unique correlative multiscale workflows that span these 3D modalities, using Atlas 5, a powerful data acquisition and multi-scale correlation tool

Register today for free!


Arno Merkle, ZEISS

Arno Merkle oversees correlative imaging and X-ray microscopy for the materials science at ZEISS Microscopy. Previously, he has held positions in product and segment management for X-ray, electron and helium ion microscopy product centers. He received his Ph.D. in Materials Science and Engineering from Northwestern University in 2007, a B.A. in Physics from Gustavus Adolphus College and is most interested in pursuing strategies to address multi-scale research challenges with an ensemble of microscopy techniques.


Fabian Perez-Willard, ZEISS

Fabián Pérez-Willard joined ZEISS Microscopy in 2006 as an application specialist for FIB-SEM and helium ion microscopes. At ZEISS, he moved to product management in 2011 before becoming part of the materials science team in 2014. Born in Spain, he completed his PhD in low-temperature physics at the University of Karlsruhe in Germany in 2003, where he then stayed on as the head of a multi-user interdisciplinary core facility with a focus on the preparation of functional nanostructures by lithography and their characterization by electron microscopy.


Previous webinars available as recordings:

Multi-scale correlative microscopy of energy storage and conversion devices
This webinar will address the need for multi-length scale characterization that addresses specific challenges in energy materials applications. In order to predict functional performance of devices and their ultimate failure modes, recent work has utilized multi-scale microscopy methods to relate microstructural observations of failures to electrochemical performance.

Click here to access the recording

Advances in Field Emission Scanning Electron Microscopy Technology
Field emission scanning electron microscopy is a standard technology for high resolution imaging and different contrasting methods – aiming for a comprehensive characterization of specimens. SEMs are typically known for their versatility: they cover a wide range of applications.

Click here to access the recording


Are you interested in applications and instruments from ZEISS, or do you have any other questions or comments for us? Get in contact via our website!

The post ZEISS and Microscopy & Analysis Present Webinars for 3D Materials Science appeared first on Microscopy News Blog.

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