ZEISS Crossbeam 550: Your FIB-SEM for High Throughput 3D Analysis and Sample Preparation

March 15, 2017
Maximize sample insights in 3D and increase your sample throughput with ZEISS Crossbeam 550. Combine the imaging and analytical performance of a ZEISS field emission scanning electron microscope with the processing performance of a next-generation focused ion beam. No matter whether you are milling, imaging or performing 3D analytics, ZEISS Crossbeam will speed up your FIB applications dramatically. http://www.zeiss.com/crossbeam
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