An overview of 3D X-ray microscopy

February 23, 2018 ZEISS Microscopy

ZEISS and Microscopy & Analysis present free guide

Scientists have long used X-rays to peer beneath the surface of solid objects, but the recent rise of 3D X-ray microscopy (XRM) means they are now able to do so in ever greater detail, allowing them to probe the secrets of matter. Unlike most forms of microscopy, XRM can deliver high resolution and contrast in three dimensions, and can do so without destroying samples.

These commercial XRM systems have a key role to play in three-dimensional (3D) imaging and tomography, offering resolutions well beyond that of classical X-ray tomography or microCT. They can provide non-destructive 3D imaging of samples across a wide range of length scales, revealing features from nanometers to millimeters. They also offer a unique opportunity to study samples in situ to examine how the microstructure changes over time, known as four-dimensional (4D) imaging. With these strengths, it should come as no surprise that XRM is being used to study an ever-increasing range of materials, from biological samples to batteries to advanced alloys to geological material, for both research and industrial applications.

This publication offers an overview of the latest XRM technology and its unique advantages. As you explore its pages, you will meet key researchers – particularly in the field of materials science – at some of the world-leading research facilities and laboratories who use XRM to meet their needs for flexible, high-resolution 3D and 4D imaging.

Download the full publication

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