ZEISS 3D Electron Microscopy for Materials Research

December 12, 2014
ZEISS Crossbeam FIB-SEM and ORION NanoFab: Your tools for nanotomography, nanopatterning and nanofabrication. Highest throughput, highest 3D resolution and always a maximum of information from your samples.
Previous Video
ZEISS ELYRA: 2014 Nobel Prize in Chemistry for Superresolution Microscopy Methods
ZEISS ELYRA: 2014 Nobel Prize in Chemistry for Superresolution Microscopy Methods

ZEISS gratulates the 2014 Nobel Prize for Chemistry laureates Eric Betzig, Stefan Hell and William Moerner....

Next Video
ZEISS LSM 880 with Airyscan: Revolutionize Your Confocal Imaging
ZEISS LSM 880 with Airyscan: Revolutionize Your Confocal Imaging

With Airyscan ZEISS introduces a new confocal concept. Instead of throwing light away at the pinhole, a 32 ...