ZEISS ATLAS for FE-SEM and FIB-SEM - 65 nm Integrated Circuit (Acid-etched)

June 11, 2012
Mapping of large-area samples with nanometer resolution, highly automated, supported by a large frame store and accompanied by a powerful viewer software - this is now possible with ATLAS system for scanning electron microscopes from ZEISS. For more information visit http://www.zeiss.com/atlas
Previous Video
ZEISS ATLAS for FE-SEM and FIB-SEM - Perfused Rat Hippocampus
ZEISS ATLAS for FE-SEM and FIB-SEM - Perfused Rat Hippocampus

Mapping of large-area samples with nanometer resolution, highly automated, supported by a large frame store...

Next Video
ZEISS ATLAS for FE-SEM and FIB-SEM - Integrated Circuit
ZEISS ATLAS for FE-SEM and FIB-SEM - Integrated Circuit

Mapping of large-area samples with nanometer resolution, highly automated, supported by a large frame store...