ZEISS ATLAS for FE-SEM and FIB-SEM - 65 nm Integrated Circuit (Acid-etched)

June 11, 2012

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Mapping of large-area samples with nanometer resolution, highly automated, supported by a large frame store and accompanied by a powerful viewer software - this is now possible with ATLAS system for scanning electron microscopes from ZEISS. For more information visit http://www.zeiss.com/atlas

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ZEISS ATLAS for FE-SEM and FIB-SEM - Integrated Circuit

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Correlating Images from Different Microscopes at Various Length Scales with ZEISS ZEN Connect

ZEISS ATLAS for FE-SEM and FIB-SEM - 65 nm Integrated Circuit (Acid-etched)

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