ZEISS ATLAS for FE-SEM and FIB-SEM - Integrated Circuit

June 11, 2012
Mapping of large-area samples with nanometer resolution, highly automated, supported by a large frame store and accompanied by a powerful viewer software - this is now possible with ATLAS for scanning electron microscopes from ZEISS. For more information visit http://www.zeiss.com/atlas
Previous Video
ZEISS ATLAS for FE-SEM and FIB-SEM - 65 nm Integrated Circuit (Acid-etched)
ZEISS ATLAS for FE-SEM and FIB-SEM - 65 nm Integrated Circuit (Acid-etched)

Mapping of large-area samples with nanometer resolution, highly automated, supported by a large frame store...

Next Video
ConfoMap - Process Measurement Data
ConfoMap - Process Measurement Data

Learn with the ConfoMap software how to process your measurement data and use: Filters, Form Removal, Profi...