ZEISS Crossbeam: Patterning of flower-type AFM tip

September 12, 2013
Patterning of flower-type AFM (Atomic Force Microscopy) tip with ZEISS Crossbeam FIB-SEM. Many applications will beneit greatly from the increased available current and the outstanding performance over the whole current range. http://www.zeiss.com/crossbeam
Previous Video
ZEISS Crossbeam: Cross-sectioning of steel
ZEISS Crossbeam: Cross-sectioning of steel

Cross-sectioning of steel with ZEISS Crossbeam FIB-SEM. Many applications will beneit greatly from the incr...

Next Video
ZEISS Crossbeam: Massive Ablation Laser Workflow
ZEISS Crossbeam: Massive Ablation Laser Workflow

ZEISS Crossbeam is unique in combining an electron microscope with extremely fast material removal and prec...