ZEISS Crossbeam technology: Interview with the Fraunhofer IWM institute

November 6, 2014
Researchers at the Frauenhofer IWM Institute in Halle, Germany discuss how they use ZEISS AURIGA FIB-SEM. Crossbeam technology by ZEISS combines the 3D imaging and analysis performance of the GEMINI e-Beam column with the ability of a FIB for material processing and sample preparation on a nanoscopic scale. http://www.zeiss.com/crossbeam
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