ZEISS MERLIN FE-SEM - Atomic Force Microscopy (AFM)

October 8, 2012

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The AFM system for ZEISS MERLIN is ready within minutes, delivering atomic surface topographical resolution in 3D. Thanks to the AFM technique these information are already calibrated on an atomic scale level, thus opening the next resolution dimension to ZEISS SEM users. For more information, visit http://www.zeiss.com/fe-sem

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